au.\*:("DEVENYI TF")
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DETERMINATION OF TRANSFER NOISE FROM TRANSFER-LOSS MEASUREMENTS IN SCCD'SDAWKUNG CHIK K; KRIEGLER RJ; DEVENYI TF et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 1; PP. 64-67; BIBL. 7 REF.Article
DETERMINATION OF SURFACE-STATE PARAMETERS FROM TRANSFER-LOSS MEASUREMENTS IN CCDSKRIEGLER RJ; DEVENYI TF; CHIK KD et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 1; PP. 398-401; BIBL. 12 REF.Article
